testsuite/gna: add test for #2264

4 files changed, 180 insertions, 0 deletions

diff --git a/testsuite/gna/issue2264/repro1.vhdl b/testsuite/gna/issue2264/repro1.vhdl
new file mode 100644
index 000000000..29ba21939
--- /dev/null
+++ b/testsuite/gna/issue2264/repro1.vhdl
@@ -0,0 +1,32 @@
+package repro1_gpkg is
+  generic (len : natural);
+
+  subtype my_nat is natural range 0 to len;
+
+  type my_rec is record
+    v : integer;
+  end record;
+
+  constant my_cst : my_rec := (v => len);
+end;
+
+package repro1_pkg4 is new work.repro1_gpkg generic map (len => 4);
+package repro1_pkg10 is new work.repro1_gpkg generic map (len => 10);
+
+
+entity repro1 is
+end;
+
+use work.repro1_pkg10.all;
+
+architecture behav of repro1 is
+begin
+  process
+    variable v : my_rec;
+  begin
+    assert my_cst.v = 10 severity failure;
+    --  Error.
+    v := work.repro1_pkg4.my_cst;
+    wait;
+  end process;
+end behav;
diff --git a/testsuite/gna/issue2264/repro2.vhdl b/testsuite/gna/issue2264/repro2.vhdl
new file mode 100644
index 000000000..c7a8963e5
--- /dev/null
+++ b/testsuite/gna/issue2264/repro2.vhdl
@@ -0,0 +1,39 @@
+package repro2_gpkg is
+  generic (len : natural);
+
+  subtype my_nat is natural range 0 to len;
+
+  type my_rec is record
+    v : integer;
+  end record;
+
+  constant my_cst : my_rec := (v => len);
+end;
+
+package repro2_gpkgpkg is
+  generic (package pkg is new work.repro2_gpkg generic map (<>));
+
+  use pkg.all;
+  constant my2_cst : my_rec := (v => len + 1);
+end;
+
+package repro2_pkg10 is new work.repro2_gpkg generic map (len => 10);
+
+package repro2_pkgpkg10 is new work.repro2_gpkgpkg generic map (pkg => work.repro2_pkg10);
+
+
+entity repro2 is
+end;
+
+use work.repro2_pkg10.all;
+use work.repro2_pkgpkg10.all;
+
+architecture behav of repro2 is
+begin
+  process
+    variable v : my_rec;
+  begin
+    assert my2_cst.v = my_cst.v + 1 severity failure;
+    wait;
+  end process;
+end behav;
diff --git a/testsuite/gna/issue2264/tb.vhdl b/testsuite/gna/issue2264/tb.vhdl
new file mode 100644
index 000000000..59f7579a1
--- /dev/null
+++ b/testsuite/gna/issue2264/tb.vhdl
@@ -0,0 +1,97 @@
+library ieee;
+use ieee.std_logic_1164.all;
+use ieee.numeric_std.all;
+
+--! Configuration data types and structures
+package test_pattern_generator_generic_pkg is
+    generic(
+        PIXEL_PER_LINE_MAX : positive := 640
+    );
+
+    --! Redeclared constants so that we don't have to pass them to dependent entities as generics again
+    constant C_PIXEL_PER_LINE_MAX : positive         := PIXEL_PER_LINE_MAX;
+
+    --! Constrained types with valid ranges for run time configurable options
+    subtype Pixel_Per_Line_t is integer range 2 to PIXEL_PER_LINE_MAX;
+
+    type Test_Pattern_Options_t is record
+        PixelPerLine  : Pixel_Per_Line_t;
+    end record Test_Pattern_Options_t;
+
+    --! Default options for a test pattern generator that are guaranteed to produce valid output
+    constant DEFAULT_OPTIONS : Test_Pattern_Options_t := (
+        PixelPerLine  => Pixel_Per_Line_t'low
+    );
+
+end package test_pattern_generator_generic_pkg;
+
+library ieee;
+use ieee.std_logic_1164.all;
+use ieee.numeric_std.all;
+
+entity test_pattern_generator is
+    generic(
+        package GENERIC_PKG_INSTANCE is new work.test_pattern_generator_generic_pkg generic map(<>)
+    );
+    port(
+        Clk          : in  std_logic;   -- Clock Signal
+        --! Generated image parameters runtime options
+        Options      : in  GENERIC_PKG_INSTANCE.Test_Pattern_Options_t
+    );
+
+end test_pattern_generator;
+
+library ieee;
+use ieee.std_logic_1164.all;
+use ieee.numeric_std.all;
+
+architecture rtl of test_pattern_generator is
+    use GENERIC_PKG_INSTANCE.all;
+    --! Pixel counter, 0 based up-counter, counts pixels in the current line
+    signal pixel_cnt : natural range 0 to GENERIC_PKG_INSTANCE.C_PIXEL_PER_LINE_MAX - 1;
+
+begin
+end architecture rtl;
+
+
+library ieee;
+use ieee.std_logic_1164.all;
+use ieee.numeric_std.all;
+
+entity test_pattern_generator_tb is
+end entity test_pattern_generator_tb;
+
+architecture sim of test_pattern_generator_tb is
+    constant CLK_PERIOD : time := 10 ns;
+
+    -- Test Pattern Generator Generics
+    constant PIXEL_PER_LINE_MAX : integer  := 160;
+
+    -- Instance for the type package for the test pattern generator
+    package test_pattern_pkg_inst is new work.test_pattern_generator_generic_pkg generic map(
+            PIXEL_PER_LINE_MAX => PIXEL_PER_LINE_MAX
+        );
+    use test_pattern_pkg_inst.all;
+
+    -- Test Pattern Generator Inputs
+    signal clk          : std_logic                                    := '0';
+    signal control_sig  : test_pattern_pkg_inst.Test_Pattern_Options_t := test_pattern_pkg_inst.DEFAULT_OPTIONS;
+    
+begin
+    test_pattern_generator_inst_tb : entity work.test_pattern_generator
+        generic map(
+            GENERIC_PKG_INSTANCE => test_pattern_pkg_inst
+        )
+        port map(
+            Clk          => clk,
+            Options      => control_sig
+        );
+
+    clk <= not clk after CLK_PERIOD / 2;
+
+    test_runner : process
+    begin
+        wait for CLK_PERIOD;
+    end process test_runner;
+
+end architecture sim;
diff --git a/testsuite/gna/issue2264/testsuite.sh b/testsuite/gna/issue2264/testsuite.sh
new file mode 100755
index 000000000..ba5697326
--- /dev/null
+++ b/testsuite/gna/issue2264/testsuite.sh
@@ -0,0 +1,12 @@
+#! /bin/sh
+
+. ../../testenv.sh
+
+export GHDL_STD_FLAGS=--std=08
+analyze_failure repro1.vhdl
+
+$GHDL -s $GHDL_STD_FLAGS repro2.vhdl
+
+clean
+
+echo "Test successful"