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authorGiovanni Di Sirio <gdisirio@gmail.com>2015-04-26 09:24:44 +0000
committerGiovanni Di Sirio <gdisirio@gmail.com>2015-04-26 09:24:44 +0000
commit65f19c1d66f34a9ca070a5d24ab4c29474f0237a (patch)
tree3fc13e2b4ef437f865dcc6a1d51c787b97eb3516 /testhal/STM32/STM32F37x/USB_CDC
parentae90e9c47b2c0cbd54cf0a07db42228f8237513e (diff)
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Added a fast interrupt to the STM32F4xx FPU stress test.
git-svn-id: svn://svn.code.sf.net/p/chibios/svn/trunk@7927 35acf78f-673a-0410-8e92-d51de3d6d3f4
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