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diff --git a/testsuite/gna/issue2264/tb.vhdl b/testsuite/gna/issue2264/tb.vhdl
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+++ b/testsuite/gna/issue2264/tb.vhdl
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+library ieee;
+use ieee.std_logic_1164.all;
+use ieee.numeric_std.all;
+
+--! Configuration data types and structures
+package test_pattern_generator_generic_pkg is
+    generic(
+        PIXEL_PER_LINE_MAX : positive := 640
+    );
+
+    --! Redeclared constants so that we don't have to pass them to dependent entities as generics again
+    constant C_PIXEL_PER_LINE_MAX : positive         := PIXEL_PER_LINE_MAX;
+
+    --! Constrained types with valid ranges for run time configurable options
+    subtype Pixel_Per_Line_t is integer range 2 to PIXEL_PER_LINE_MAX;
+
+    type Test_Pattern_Options_t is record
+        PixelPerLine  : Pixel_Per_Line_t;
+    end record Test_Pattern_Options_t;
+
+    --! Default options for a test pattern generator that are guaranteed to produce valid output
+    constant DEFAULT_OPTIONS : Test_Pattern_Options_t := (
+        PixelPerLine  => Pixel_Per_Line_t'low
+    );
+
+end package test_pattern_generator_generic_pkg;
+
+library ieee;
+use ieee.std_logic_1164.all;
+use ieee.numeric_std.all;
+
+entity test_pattern_generator is
+    generic(
+        package GENERIC_PKG_INSTANCE is new work.test_pattern_generator_generic_pkg generic map(<>)
+    );
+    port(
+        Clk          : in  std_logic;   -- Clock Signal
+        --! Generated image parameters runtime options
+        Options      : in  GENERIC_PKG_INSTANCE.Test_Pattern_Options_t
+    );
+
+end test_pattern_generator;
+
+library ieee;
+use ieee.std_logic_1164.all;
+use ieee.numeric_std.all;
+
+architecture rtl of test_pattern_generator is
+    use GENERIC_PKG_INSTANCE.all;
+    --! Pixel counter, 0 based up-counter, counts pixels in the current line
+    signal pixel_cnt : natural range 0 to GENERIC_PKG_INSTANCE.C_PIXEL_PER_LINE_MAX - 1;
+
+begin
+end architecture rtl;
+
+
+library ieee;
+use ieee.std_logic_1164.all;
+use ieee.numeric_std.all;
+
+entity test_pattern_generator_tb is
+end entity test_pattern_generator_tb;
+
+architecture sim of test_pattern_generator_tb is
+    constant CLK_PERIOD : time := 10 ns;
+
+    -- Test Pattern Generator Generics
+    constant PIXEL_PER_LINE_MAX : integer  := 160;
+
+    -- Instance for the type package for the test pattern generator
+    package test_pattern_pkg_inst is new work.test_pattern_generator_generic_pkg generic map(
+            PIXEL_PER_LINE_MAX => PIXEL_PER_LINE_MAX
+        );
+    use test_pattern_pkg_inst.all;
+
+    -- Test Pattern Generator Inputs
+    signal clk          : std_logic                                    := '0';
+    signal control_sig  : test_pattern_pkg_inst.Test_Pattern_Options_t := test_pattern_pkg_inst.DEFAULT_OPTIONS;
+    
+begin
+    test_pattern_generator_inst_tb : entity work.test_pattern_generator
+        generic map(
+            GENERIC_PKG_INSTANCE => test_pattern_pkg_inst
+        )
+        port map(
+            Clk          => clk,
+            Options      => control_sig
+        );
+
+    clk <= not clk after CLK_PERIOD / 2;
+
+    test_runner : process
+    begin
+        wait for CLK_PERIOD;
+    end process test_runner;
+
+end architecture sim;