From f206183eb4eaa340deba83afde3d0110f3afad6e Mon Sep 17 00:00:00 2001 From: Anastasia Klimchuk Date: Mon, 21 Nov 2022 12:50:07 +1100 Subject: opaque_master: Mark Opaque chip as tested for WP Opaque masters, by design, populate the flashchip structure during the execution of their probe function. Therefore any opaque master operation displays a message to the user: "This flash part has status UNTESTED for operations: WP". However, for all the other operations (read, write, erase) opaque masters always mark them as tested. Thus, align WP as marked tested inline with other opaque chip operations. BUG=b:258755442 TEST=the following does not display untested message: 1) flashrom -p dummy:size=8388608,emulate=VARIABLE_SIZE 2) flashrom -p internal (on Intel device) Change-Id: I5ae4cb49eb0abc6ab26cfe2f3359e4e50dd4fd4f Signed-off-by: Anastasia Klimchuk Reviewed-on: https://review.coreboot.org/c/flashrom/+/69842 Tested-by: build bot (Jenkins) Reviewed-by: Edward O'Callaghan Reviewed-by: Sergii Dmytruk Reviewed-by: Felix Singer --- ichspi.c | 2 +- 1 file changed, 1 insertion(+), 1 deletion(-) (limited to 'ichspi.c') diff --git a/ichspi.c b/ichspi.c index 4e982f08..cd330e3b 100644 --- a/ichspi.c +++ b/ichspi.c @@ -1485,7 +1485,7 @@ static int ich_hwseq_probe(struct flashctx *flash) msg_cdbg("In that range are %d erase blocks with %d B each.\n", size_high / erase_size_high, erase_size_high); } - flash->chip->tested = TEST_OK_PREW; + flash->chip->tested = TEST_OK_PREWB; return 1; } -- cgit v1.2.3